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Atomic layer deposition (ALD)

An advanced deposition technique that allows for ultra-thin films of a few nanometres to be deposited in a precisely controlled way

Atomfab

Atomfab PEALD system delivers fast, low damage, low CoO production plasma ALD processing for GaN power and RF devices

Atomic layer deposition (ALD)

  • High quality films grown with ultimate thickness accuracy, one atomic layer at a time
  • Up to 200 mm wafer with typical uniformity <±2%
  • Excellent step coverage even inside high aspect ratio structures
  • Highly-conformal coating
  • Low pin-hole and particle levels
  • Low damage & low-temperature process
  • Reduced nucleation delay
  • Wide range of materials and processes
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ALD process

ALD typically involves a cycle of 4 steps that is repeated as many times as necessary to achieve the required deposited thickness. The example below shows ALD of Al2O3 using Al(CH3), (TMA) and O2 plasma.

Step 1) Dosing of the substrate with a precursor vapour of TMA, which adsorbs on and reacts with the surface. With the correct choice of precursor and parameters, this reaction is self-limiting.

Step 2) Purging of all residual precursor and reaction products.

Step 3) Low damage remote plasma exposure to the surface with reactive oxygen radicals which oxidise the surface and remove surface ligands. This reaction is self-limiting due to the limited number of surface ligands.

Step 4) Reaction products are purged from the chamber.

Only step 3 varies between H2O for the thermal process or O2 plasma. As the ALD process deposits a (sub)angstrom thickness per cycle, control over the deposition process is obtained at the atomic scale.

1st half-cycle

Purge

2nd half-cycle

Purge

ALD overview


ALD is an advanced deposition technique that allows for ultra-thin films of a few nanometres to be deposited in a precisely controlled way. Not only does ALD provide excellent thickness control and uniformity, but 3D structures can be covered with a conformal coating for high-aspect-ratio structures.

ALD relies on self-limiting surface reactions and therefore generally provides very low pin-hole and particle levels, which can benefit a wide range of applications. The level of film/interface control and high film quality provided are sought after for many applications. The usage of plasma allows for improved film properties, control thereof and a wide range of possible materials. The flexibility of unique surface pre-treatments allows for low damage processing.

ALD benefits


Thermal ALD

  • Conformal coating can be achieved even in high aspect ratio and complex structures
  • A wide variety of materials is possible with ALD, such as:
    • Oxides:
      Al2O3, HfO2, SiO2, TiO2, SrTiO3, Ta2O5, Gd2O3, ZrO2, Ga2O3, V2O5, Co3O4, ZnO, ZnO:Al, ZnO:B, In2O3:H, WO3, MoO3, Nb2O5, NiO, MgO, RuO2
    • Fluorides: MgF2, AlF3
    • Organic-hybrid materials: Alucone
    • Nitrides: TiN, TaN, Si3N4, AlN, GaN, WN, HfN, NbN, GdN, VN, ZrN
    • Metals: Pt, Ru, Pd, Ni, W
    • Sulfides: ZnS, MoS2

Conformal coating of high aspect ratio (15:1) structure with high-rate plasma ALD SiO2

Al2O3 deposited by FlexAL ALD - Courtesy by Eindhoven University of Technology

Plasma enhanced ALD (PEALD)

In addition to the benefits of thermal ALD, plasma enhanced (PEALD) allows for a wider choice of precursor chemistry with enhanced film quality:

  • Plasma enables low-temperature ALD processes and the remote source maintains low plasma damage
  • Eliminates the need for water as a precursor, reducing purge times between ALD cycles - especially for low temperatures
  • Higher quality films through improved removal of impurities, leading to lower resistivity, higher density, etc
  • Effective metal chemistry through use of hydrogen plasma
  • Ability to control stoichiometry/phase
  • Reduced nucleation delay
  • Plasma surface treatment
  • Plasma cleaning of chamber is possible for some materials

Conformal deposition of SiO2, TiO2 and Al2O3 by plasma ALD, (CC BY 4.0 license), image library at www.AtomicLimits.com, 2021

ALD features


  • Guaranteed processes set up by our engineers
  • Plasma surface pre-treatments
  • Oxides
    • Low-temperature processing with high material quality
    • Doping and mixing
  • Nitrides
    • Low resistivity
    • Low oxygen content, high refractive index
  • Metals
    • Low nucleation delay with plasma
    • Low-temperature deposition
  • Substrate biasing:
    • During plasma, ALD to control material properties
      • Stress, density, crystallinity (and others)
    • Before plasma ALD to pre-clean substrate surfaces
      • Etches Al2O3, HfO2, SiO2, Si3N4
    • After plasma, ALD to modify material and surface properties
  • Option to have substrate biasing for further process control and improved material properties.

ALD processes


2D materials

2D materials growth can also be grown by ALD which is a new development with the aim to go toward high-quality transition metal dichalcogenide (TMD) films. ALD chemistry control has the promise to be able to utilise 2D TMDs (both n-type and p-type) with their unique properties at CMOS compatible temperatures with precise digital thickness control over a large area (200 mm wafers).

Wide range of materials

A wide variety of materials is possible with ALD and a wide range of processes can be guaranteed and set up by our process engineers. For novel processes, our extensive process knowledge and vast network allow us to provide starting point recipes that should be good starting blocks to go quickly towards a robust process.

Often plasma-based processes are available utilising our plasma knowledge and handling of mass flow controller (MFC) gas mixtures including toxic gases.

Metals

Fluorides

Sulfides

Selenides

Pt

AlF3

MoS2

MoSe2

Ru

MgF2

WS2

WSe2

Oxides

Nitrides

Al2O3


AlN

Co3O4


Ga2O3

GaN

HfO2

HfN

In2O3

Li2CO3

MoO3

Nb2O5


NbN

NiO

SiO2

Si3N4

SnO2

Ta2O5

TaN

TiO2

TiN

WO3

WN

ZnO

ZrO2

Featured ALD products

Atomfab 

Atomfab is the fastest remote plasma production ALD system on the market

Solutions for your productions needs:

  • Competitive CoO
  • Quick, easy maintenance
  • Excellent film uniformity
  • High material quality
  • Low substrate damage
  • Faster cycles times, high throughput
  • Clusterable and automated wafer handling

Atomfab gallery

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Atomfab benefits


Atomfab's ALD technology offers precisely controlled ultra‑thin films for advanced applications on the nanometre scale, with conformal coating of sensitive substrate structures.

Process benefits for passivation of power and RF devices

  • Guaranteed processes setup by our engineers
  • Lifetime process support for additional/new processes
  • Low-damage plasma processing
  • High quality deposition with low film contamination
  • Low particle levels
  • Short plasma exposure times enabling high throughput
  • Plasma surface pre-treatments

Advantages of plasma ALD for GaN, power and RF devices

  • With plasma pre-treatment prior to deposition to enhance interface quality
  • Low damage, uniform deposition
  • Remote plasma ALD with controlled ion energy from near zero to 30 eV
  • ALD passivation, gate dielectric by Al2O3 films.

Read more about how ALD can optimise GaN power devices in our white paper.

Atomfab features


Revolutionary plasma source: Atomfab system uses a patent pending remote source specifically designed for atomic scale processing.

  • Low damage for sensitive substrates for maximum device performance
  • Fast cycle times and reliablity with uniform plasma exposure and film deposition
  • Short plasma times (250 ms) enabled by patent-pending AMU
  • Short strike time (80 ms) for high throughput
  • Reproducible strike time and low reflected power for high yield

Plasma ALD Al2O3 at 300 °C

Specification

Within wafer thickness uniformity

<±1.0%

Wafer-to-wafer thickness repeatability

<±1.0%

Breakdown voltage

≥7.0 MV/cm

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PlasmaPro ASP

Based on production-proven platform for corporate/specialised R&D, PlasmaPro ASP has been designed to ensure high quality materials that can be deposited at speed with flexibility to run multiple chemistries to give excellent layers for incorporation into devices. Our cutting-edge plasma enhanced ALD (PEALD) system offers flexibility, conformality, and tunability of ALD with speed for higher throughput and thicker films.

  • Faster than conventional remote plasma

  • Reduced precursor consumption which is beneficial for the environment and cost of running
  • High material quality
  • Low cost of ownership
  • Improved serviceability and maintenance
  • Low volume chamber for speed
  • Low substrate damage
  • Higher process stability
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PlasmaPro ASP overview


PlasmaPro ASP has shared platform with Atomfab to deliver fast and low damage remote PEALD. Remote PEALD offers superior device performance compared to thermal ALD and direct plasma ALD. It is compact to limit the effective chamber volume for rapid gas exchange and it is effective over the full 200 mm wafer diameter.​

PlasmaPro ASP features


  • High speed remote plasma source
    - High and uniform radical density and low ion energies for low damage, fast saturation
    - PLC and AMU control allows rapid striking
  • Excellent precursor and process control
    - Up to 6 precursors, bubbled or vapour drawn
  • Wafer electrode
    - 200 mm wafer electrode with bias
    - Up to 400 °C deposition temp.
    - 200 °C heated inner chamber
  • Control system
    - Ease of service and simplified wiring
    - Improved diagnostics for service
    - No separate ‘electronics’ rack
  • Ease of cleaning
    - Removable metal surfaces in chamber
    - Purged outer chamber and lower pumping areas

PlasmaPro ASP applications


  • Low damage GaN HEMT passivation for power electronics and RF devices
    • Low-oxygen content conductive nitrides with all-metal plasma source enabling fast cycle times, suitable for quantum devices
    • Low damage graphene encapsulation for datacom applications

    450 nm conformal SiO2 deposited in 32:1 aspect ratio trench using PlasmaPro ASP.

    130 nm conformal superconducting NbN deposited in 8:1 aspect ratio trench using PlasmaPro ASP.

    PlasmaPro ASP specifications


    Specifications

    PlasmaPro ASP

    Precursor lines

    Maximum 6 (any combination)​

    Precursor size (ml)

    200

    Precursor type

    • Vapour draw - cooled ​
    • Vapour draw - heated ​
    • Bubbled – heated

    Handling

    Loadlock

    Gas pod

    4 Process + 1 Ar (onboard)

    Electrode

    400 °C grounded/ biased

    Roughing pump

    600 m3/hr

    Compliance

    UL Standard, designed for SEM 2S

    Software

    PTIQ

    PEALD process library

    Al2O3, SiO2, NbN, TiN, more in development

    Global customer support

    Oxford Instruments is committed to providing a comprehensive, flexible and reliable global customer support. We offer excellent quality service throughout the life of your system.

    • Remote diagnostics software provides quick and easy fault diagnosis and resolution.
    • Support contracts are available to suit the budget and situation.
    • Global spares in strategic locations for quick response.
    Find out more

    NEW: PTIQ software

    PTIQ is the latest intelligent software solution for PlasmaPro and Ionfab processing equipment.

    • Exceptional level of responsive system control
    • Optimise system and process performance
    • Different levels of software to suit your requirements
    • Brand new intuitive layout and design
    Find out more

    Explore our comprehensive technical training courses

    At Oxford Instruments Plasma Technology, we offer a wide range of technical training courses designed to suit all skill levels and needs.

    • Level 1 (Introductory): New system users for all platforms
    • Level 2 (Intermediate): Equipment and maintenance training for all platforms
    • Level 3 (Advanced): for plasma etch and deposition, ion beam and PEALD systems
    • Specialist technical modules: process and handler technical training for all platforms
    Find out more

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