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Our Customers' Research

Publications Database

We are proud of the ground-breaking R&D our customers are doing on our systems and we want to spread the word of their work.

Our customers' research has a huge contribution towards technological advancements that positively impact many disciplines from novel optoelectronics and quantum technologies to advanced materials.

If you like to send us your published research, please complete the form and submit your publication link, including the Oxford Instruments deposition or etch system that has been used in the course of your work.

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Our Customers' Published Research

Date

Research paper

Authors & publication link

Used OI system/technology

Applications

January 2026

Surface Smoothing by Atomic Layer Deposition and Etching for the Fabrication of Nanodevices

Sven H. Gerritsen, Nicholas J. ChittockVincent Vandalon, Marcel A. Verheijen, Harm C. M. Knoops, Wilhelmus M. M. Kessels, Adriaan J. M. Mackus.

    FlexAL ALD

    Quantum, Semiconductors

    January 2026

    Investigation of the atomic layer etching mechanism for Al2O3 using hexafluoroacetylacetone and H2 plasma

    Nicholas J. Chittock, Joost F. W. Maas, Ilker Tezsevin, Marc J. M. Merkx, Harm C. M. Knoops, Wilhelmus M. M. (Erwin) Kessels and Adriaan J. M. Mackus.

    FlexAL ALD

    Semiconductors

    November 2025

    Atomic layer etching of TiN by oxidation and SF6-H2 plasma exposure: ALE window defined by HF, H, and F

    Guillaume Krieger, Silke A. Peeters, Bob J. M. Vonken, Nicholas J. Chittock, Adriaan J. M. Mackus, Wilhelmus M. M. (Erwin) Kessels, Harm C. M. Knoops.

    FlexAL ALD

    Quantum

    November 2025

    Effects of grain size and crystallographic orientation on plasma etching behavior in tungsten carbide

    Hun Shim, Dongjun Lee, Jeongseok Kim, Seong-Hyeon Hong.

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    November 2025

    Atomic layer etching of niobium nitride using sequential exposures of O2 and H2/SF6 plasmas

    Azmain A. Hossain, Sela Murphy, David S. Catherall, Anthony J. Ardizzi, Austin J. Minnich.

    FlexAL ALD

    Quantum

    November 2025

    Cryogenic atomic layer etching of SiO2 based on cyclic CF4/Ar plasma

    Madjid Adjabi, Thomas Tillocher, Philippe Lefaucheux, Eva Kovacevic, and Rémi Dussart

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    November 2025

    Cryogenic cyclical etching of Si using CF_4 plasma passivation steps: The role of CF radicals

    Jack Nos, Sylvain Iséni, Martin Kogelschatz, Gilles Cunge, Philippe Lefaucheux, Rémi Dussart, Thomas Tillocher, Émilie Despiau-Pujo

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    November 2025

    Cryogenic etching of SiOxFy and SiO2 in SF6/H2 plasma

    R. Dussart, T. Tillocher, L. Becerra, P. Lefaucheux, and L. J. Overzet.

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    November 2025

    Scrutinizing pre- and post-device fabrication properties of atomic layer deposition WS2 thin films

    Emma Coleman, Scott Monaghan, Farzan Gity, Gioele Mirabelli, Brendan Sheehan, Shashank Balasubramanyam, Ageeth A. Bol, Paul Hurley

    FlexAL ALD

    Semiconductors

    June 2025

    Superconducting NbTiN prepared at high deposition rates with plasma-enhanced atomic layer deposition and substrate biasing

    Silke A. Peeters, Lisa E.W. H. M. Nelissen, Dmytro Besprozvannyy, Nidhi Choudhary, Ciaran T. Lennon, Marcel A. Verheijen, Michael Powell, Louise Bailey, Robert H. Hadfield, W. M. M. (Erwin) Kessels, Harm C. M. Knoops.

    PlasmaPro ASP

    Quantum

    April 2025

    Significant improvement of breakdown voltage of AlGaN Schottky barrier diodes by atomic layer etching

    Tingang Liu, Zhiyuan Liu, Haicheng Cao, Mingtao Nong, Xiao Tang, Zixian Jiang, Glen Isaac Maciel Garcia, Kexin Ren, Xiaohang Li

    PlasmaPro 100 ALE

    Power devices, Discretes (GaN PE/RF)

    March 2025

    Line width narrowing of superconducting nanowire single photon detectors using atomic layer etching

    Daniel N. Shanks, Jason P. Allmaras, Sahil R. Patel, Boris A. Korzh, Emma E. Wollman, Frank Greer, Andrew D. Beyer, Matthew D. Shaw

    PlasmaPro 100 Cobra ICP RIE

    Quantum

    December 2024

    Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias

    Zhong Ren, Yi Shu, Ciaran T. Lennon, Harm Knoops, Russ Renzas, Robert H. Hadfield, James Watt, Mike Cooke

    PlasmaPro 100 Cobra ICP RIE, FlexAL ALDPlasmaPro 100 EstrelasPlasmaPro 80 RIE

    Quantum

    November 2024

    Isotropic atomic layer etching of MgO-doped lithium niobate using sequential exposures of H2 and SF6/Ar plasmas

    Ivy I. Chen, Jennifer Solgaard, Ryoto Sekine, Azmain A. Hossain, Anthony Ardizzi, David S. Catherall, Alireza Marandi, James R. Renzas, Frank Greer, Austin J. Minnich

    PlasmaPro 100 Cobra ICP RIE

    Optoelectronics, Datacom, Quantum

    November 2024

    Digital Etching of Molybdenum Interconnects Using Plasma Oxidation

    Ivan Erofeev, Antony Winata Hartanto, Muhaimin Mareum Khan, Kerong Deng, Krishna Kumar, Zainul Aabdin, Weng Weei Tjiu, Mingsheng Zhang, Antoine Pacco, Harold Philipsen, Angshuman Ray Chowdhuri, Han Vinh Huynh, Frank Holsteyns, Utkur Mirsaidov

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    October 2024

    Demonstration of Normally-Off N-Polar GaN Deep Recess HEMT

    Oguz Odabasi, Md. Irfan Khan, Kamruzzaman Khan, Elaheh Ahmadi


    PlasmaPro 100 ALE

    Power devices, Discretes (GaN PE/RF)

    March 2024

    Atomic layer etching of indium tin oxide

    Christoffer Kauppinen

    PlasmaPro 100 Cobra ICP RIE

    Semiconductors

    September 2023

    Ultrathin superconducting TaCxN1−x films prepared by plasma-enhanced atomic layer deposition with ion-energy control

    Silke A. Peeters, Ciaran T. Lennon, Marc J. M. Merkx, Robert H. Hadfield, W. M. M. (Erwin) Kessels, Marcel A. Verheijen, Harm C. M. Knoops

    FlexAL ALD

    Semiconductors

    September 2023

    Quasiatomic layer etching of silicon nitride enhanced by low temperature

    Daniel N. Shanks, Rania K. Ahmed, John D. Femi-Oyetoro, Matthew R. Dickie, Andrew D. Beyer, Frank Greer

    PlasmaPro 100 Cobra ICP RIE

    RF Devices

    August 2023

    Improving Performance and Breakdown Voltage in Normally-Off GaN Recessed Gate MIS-HEMTs Using Atomic Layer Etching and Gate Field Plate for High-Power Device Applications

    An-Chen Liu, Po-Tsung Tu, Hsin-Chu Chen, Yung-Yu Lai, Po-Chun Yeh, Hao-Chung Kuo

    PlasmaPro 100 Cobra ICP RIE

    Power devices, Discretes (GaN PE/RF)

    August 2023

    Atomic layer etching (ALE) of III-nitrides

    Wan Ying Ho, Yi Chao Chow, Zachary Biegler, Kai Shek Qwah,Tanay Tak, Ashley Wissel-Garcia, Iris Liu, Feng Wu, Shuji Nakamura, James S. Speck

    PlasmaPro 100 ALE

    Semiconductors, Power Devices, Quantum

    July 2023

    Hybrid electronic–photonic sensors on a fibre tip

    L. Picelli, P. J. van Veldhoven, E. Verhagen and A. Fiore

    PlasmaPro 100 RIEPlasmaPro 100 Cobra ICP RIE

    Optoelectronics, Datacom

    May 2023

    Bias-pulsed atomic layer etching of 4H-silicon carbide producing subangstrom surface roughness

    J. A. Michaels, N. Delegan, Y. Tsaturyan, J. R. Renzas, D. D. Awschalom, J. G. Eden and F. J. Heremans

    PlasmaPro 100 Cobra

    Semiconductors, Quantum

    November 2022

    Method for Keyhole-Free High-Aspect-Ratio Trench Refill by LPCVD

    Henk-Willem Veltkamp, Yves L. Janssens, Meint J. de Boer, Yiyuan Zhao, Remco J. Wiegerink, Niels R. Tas and Joost C. Lötters

    PlasmaPro 100 Estrelas

    Micro Electro Mechanical Systems (MEMS)

    September 2022

    Origin of interfacial charges of Al2O3/Si and Al2O3/GaN heterogeneous heterostructures

    Chuanju Wang, Feras AlQatari, Vishal Khandelwal, Rongyu Lin and Xiaohang Li

    FlexAL ALD

    Semiconductors

    August 2022

    Atomic Layer Deposition of Large-Area Polycrystalline Transition Metal Dichalcogenides from 100 °C through Control of Plasma Chemistry

    Miika Mattinen, Farzan Gity, Emma Coleman, Joris F. A. Vonk, Marcel A. Verheijen, Ray Duffy, Wilhelmus M. M. Kessels and Ageeth A. Bol

    FlexAL ALD

    2D Materials

    June 2022

    ICP etching of GaN microstructures in a Cl2–Ar plasma with subnanometer-scale sidewall surface roughness

    Clint D. Frye, Catherine E. Reinhardt, Scott B. Donald, Lars F. Voss and Sara E. Harrison

    PlasmaPro 100 ICP

    Power devices, Discretes (GaN PE/RF)

    May 2022

    Highly suppressed interface traps of Al2O3/GaN through interposing a stoichiometric Ga2O3 layer

    Chuanju Wang, Yi Lu, Che-Hao Liao, Shibin Chandroth, Saravanan Yuvaraja and Xiaohang Li

    FlexAL ALD

    Semiconductors

    May 2022

    Plasma enhanced atomic layer etching of high-k layers on WS2

    J.-F. de Marneffe, D. Marinov, A. Goodyear, P.-J. Wyndaele, N. St. J. Braithwaite, S. Kundu, I. Asselberghs, M. Cooke and S. De Gendt

    PlasmaPro 100 ICP, PlasmaPro 100 ALE

    2D Materials

    May 2022

    High synergy atomic layer etching of AlGaN/GaN with HBr and Ar

    Kevin G. Crawford, James Grant, Dilini Tania Hemakumara, Xu Li, Iain Thayne and David A. J. Moran

    PlasmaPro 100 ALE

    Power Devices

    January 2022

    Surface-Oxide-Controlled InAlGaN/GaN High-Electron-Mobility Transistors Using Al2O3-Based Insulated-Gate Structures with H2O Vapor Pretreatment

    Shiro Ozaki, Junya Yaita, Atsushi Yamada, Yuichi Minoura, Toshihiro Ohki, Naoya Okamoto, Norikazu Nakamura and Junji Kotani

    FlexAL ALD

    Power Devices

    October 2021

    On the quantification of Auger recombination in crystalline silicon

    Lachlan E. Black and Daniel H. Macdonald

    FlexAL ALD

    Semiconductors

    September 2021

    Innovative remote plasma source for atomic layer deposition for GaN devices

    Harm C. M. Knoops, Karsten Arts, Jan W. Buiter, Luca Matteo Martini, Richard Engeln, Dilini Tania Hemakumara, Michael Powell, Wilhelmus M. M. (Erwin) Kessels, Chris J. Hodson and Aileen O’Mahony

    Atomfab ALD

    RF Devices, Power Devices

    September 2021

    Effect of O2 plasma exposure time during atomic layer deposition of amorphous gallium oxide

    Hanno Kröncke, Florian Maudet, Sourish Banerjee, Jürgen Albert, Sven Wiesner, Veeresh Deshpande and Catherine Dubourdieu

    FlexAL ALD

    Semiconductors

    July 2021

    Plasma-Enhanced Atomic Layer Deposition of Al2O3 on Graphene Using Monolayer hBN as Interfacial Layer

    Bárbara Canto, Martin Otto, Michael J. Powell, Vitaliy Babenko, Aileen O'Mahony, Harm C. M. Knoops, Ravi S. Sundaram, Stephan Hofmann, Max C. Lemme and Daniel Neumaier

    Atomfab ALD, FlexAL ALD

    2D Materials, Optoelectronics, NEMS

    April 2021

    Impact of Ions on Film Conformality and Crystallinity during Plasma-Assisted Atomic Layer Deposition of TiO2

    Karsten Arts, Harvey Thepass, Marcel A. Verheijen, Riikka L. Puurunen, Wilhelmus M. M. Kessels and Harm C. M. Knoops

    FlexAL ALD

    Semiconductors

    February 2021

    Selective etching of p-GaN over Al0.25Ga0.75N in Cl2/Ar/O2 ICP plasma for fabrication of normally-off GaN HEMTs

    Andrzej Taube, Maciej Kamiński, Marek Ekielski, Renata Kruszka, Joanna Jankowska-Śliwińska, Paweł P. Michałowski, Joanna Zdunek and Anna Szerling

    Plasmalab 100 ICP 180

    Discretes (GaN PE/RF)

    October 2020

    Creation of regular arrays of faceted AlN nanostructures via a combined top-down, bottom-up approach

    R. Armstrong, P.-M. Coulon, P. Bozinakis, R. W. Martin and P. A. Shields

    PlasmaPro 100 Cobra ICP Etching

    Optoelectronics, Quantum, Semiconductors

    August 2020

    Area-Selective Atomic Layer Deposition of TiN Using Aromatic Inhibitor Molecules for Metal/Dielectric Selectivity

    Marc J. M. Merkx, Sander Vlaanderen, Tahsin Faraz, Marcel A. Verheijen, Wilhelmus M. M. Kessels and Adriaan J. M. Mackus

    FlexAL ALD

    Semiconductors

    April 2020

    Polarity dependence in Cl2-based plasma etching of GaN, AlGaN and AlN

    Matthew D. Smith, Xu Li, Michael J. Uren, Iain G. Thayne and Martin Kuball

    PlasmaPro 80 ICP Etching

    Optoelectronics, Power Devices, Quantum, RF Devices

    March 2020

    Low damage etching by Inductively Coupled Plasma Reactive Ion Etch (ICP-RIE) and Atomic Layer Etching (ALE) of III-V materials to enable next generation device performance

    Mark Dineen, Matthew Loveday, Andy Goodyear, Mike Cooke, Andrew Newton, Stephanie Baclet, Craig Ward and Tania Hemakumara

    PlasmaPro 100 Cobra ICPPlasmaPro 100 ALE

    RF Devices, Power Devices

    February 2020

    Development of low-loss TiO2 waveguides

    I. Hegeman, M. Dijkstra, F. B. Segerink, W. Lee and S. M. Garcia-Blanco

    PlasmaPro 100 RIE

    Optoelectronics

    January 2020

    Layer-by-Layer Thinning of PdSe2 Flakes via Plasma Induced Oxidation and Sublimation

    Anna N. Hoffman, Yiyi Gu, Justin Tokash, Jonathan Woodward, Kai Xiao and Philip D. Rack

    PlasmaPro 100 Cobra ICP, PlasmaPro 100 ALE

    2D Materials

    December 2019

    Tuning high-Q superconducting resonators by magnetic field reorientation

    Christoph W. Zollitsch, James O’Sullivan, Oscar Kennedy, Gavin Dold and John J. L. Morton

    PlasmaPro 100 RIE

    Quantum

    October 2019

    High Power Si Sidewall Heaters for Fluidic Applications Fabricated by Trench-Assisted Surface Channel Technology

    H. Veltkamp, Y. Zhao, M. J. de Boer, R. G. P. Sanders, R. J. Wiegerink and J. C. Lötters

    PlasmaPro 100 Estrelas (Bosch-based DRIE), Ionfab IBE, PlasmaPro 80 PECVD

    Micro Electro Mechanical Systems (MEMS)

    September 2019

    Balancing ion parameters and fluorocarbon chemical reactants for SiO2 pattern transfer control using fluorocarbon-based atomic layer etching

    Stefano Dallorto, Monica Lorenzon, Julia Szornel, Adam Schwartzberg, Andy Goodyear, Mike Cooke, Martin Hofmann, Ivo W. Rangelow and Stefano Cabrini

    PlasmaPro 100 Cobra ICP, PlasmaPro 100 ALE

    Semiconductors, MEMs, Optoelectronics

    May 2019

    Atomic layer etching of SiO2 with Ar and CHF3 plasmas: A self‐limiting process for aspect ratio independent etching

    Stefano Dallorto, Andy Goodyear, Mike Cooke, Julia E. Szornel, Craig Ward, Christoph Kastl, Adam Schwartzberg, Ivo W. Rangelow and Stefano Cabrini

    PlasmaPro 100 Cobra ICP, PlasmaPro 100 ALE

    Semiconductors, MEMs, Optoelectronics

    May 2019

    A route towards the fabrication of 2D heterostructures using atomic layer etching combined with selective conversion

    Markus H. Heyne, Daniil Marinov, Nicholas Braithwaite, Andy Goodyear, Jean-François de Marneffe, Mike Cooke, Iuliana Radu, Erik C. Neyts and Stefan De Gendt

    PlasmaPro 100 Cobra ICP

    2D Materials

    September 2018

    Ion energy measurements for Fluorocarbon-based Atomic Layer Etching

    Stefano Dallorto, Andy Goodyear, Mike Cooke, Scott Dhuey, Adam Schwartzberg, Craig Ward, Ivo Rangelow and Stefano Cabrini

    PlasmaPro 100 ALE

    Semiconductors, MEMs, Optoelectronics

    May 2018

    High-Definition Nanoimprint Stamp Fabrication by Atomic Layer Etching

    Sabbir A. Khan, Dmitry B. Suyatin, Jonas Sundqvist, Mariusz Graczyk, Marcel Junige, Christoffer Kauppinen, Anders Kvennefors, Maria Huffman and Ivan Maximov

    Plasmalab 100 ALE

    Quantum

    March 2018

    Tuning Material Properties of Oxides and Nitrides by Substrate. Biasing during Plasma-Enhanced Atomic Layer Deposition on Planar and 3D Substrate Topographies

    Tahsin Faraz, Harm C. M. Knoops, Marcel A. Verheijen, Cristian A. A. van Helvoirt, Saurabh Karwal, Akhil Sharma, Vivek Beladiya, Adriana Szeghalmi, Dennis M. Hausmann, Jon Henri, Mariadriana Creatore and Wilhelmus M. M. Kessels

    FlexAL ALD

    Semiconductors

    August 2017

    Atomic layer etching of gallium nitride (0001)

    Christoffer Kauppinena, Sabbir Ahmed Khanc, Jonas Sundqvist, Dmitry B. Suyatin, Sami Suihkonen, Esko I. Kauppinen and Markku Sopanen

    Plasmalab 100 ALE

    Discretes (GaN PE/RF)

    July 2017

    Low damage plasma etch processes for AlGaN and GaN substrates

    Matthew Loveday, Andy Goodyear, Mike Cooke, Andrew Newton, Mark Dineen, Stephanie Baclet and Paolo Abrami

    PlasmaPro 100 Cobra ICP, PlasmaPro 100 ALEPlasmaPro 100 RIE

    RF Devices, Power Devices

    July 2017

    Low damage cyclical etching of GaN and AlGaN

    A. Goodyear, P. Abrami, M. Loveday and M. Cooke

    PlasmaPro 100 Cobra ICPPlasmaPro 100 ALE

    RF Devices, Power Devices

    April 2017

    A Raman metrology approach to quality control of 2D MoS2 film fabrication

    Elisha Mercado, Andy Goodyear, Jonathan Moffat, Mike Cooke and Ravi S. Sundaram

    PlasmaPro 100 ALE, PlasmaPro 100 Cobra, PlasmaPro 100 Nano CVD

    Optoelectronics, 2D Materials

    March 2017

    Selective patterning of amorphous silicon on MoS2 to fabricate transition-metal dichalcogenide heterostructures

    Markus Heyne, Andy Goodyear, Jean-Francois de Marneffe, Mike Cooke, Iuliana Radu, Erik C Neyts and Stefan De Gendt

    PlasmaPro 100 Cobra ICP, PlasmaPro 100 ALE

    2D Materials

    January 2017

    Atomic layer etching of amorphous silicon with selectivity towards MoS2 for novel MX2 heterostructure device concepts

    Markus Heyne, Andy Goodyear, Jean-François de Marneffe, Mike Cooke, Erik C. Neyts, Iuliana Radu and Stefan De Gendt

    PlasmaPro 100 ALE

    2D Materials

    December 2016

    Material and optical properties of low-temperature NH3-free PECVD SiNx layers for photonic applications

    Thalía Domínguez Bucio, Ali Z. Khokhar, Cosimo Lacava, Stevan Stankovic, Goran Z. Mashanovich, Periklis Petropoulos and Frederic Y. Gardes

    PlasmaPro 100 PECVD

    Photonics, Optoelectronics

    December 2016

    Atomic layer etching in close-to-conventional plasma etch tools

    Andy Goodyear and Mike Cooke

    PlasmaPro 100 Cobra ICP

    Semiconductors

    September 2016

    Optical emission monitoring for optimisation of Atomic Layer Etch (ALE) processes

    Andy Goodyear and Mike Cooke

    PlasmaPro 100 ALE

    Semiconductors

    February 2016

    Ultra-low temperature silicon nitride photonic integration platform

    Zengkai Shao, Yujie Chen, Hui Chen, Yanfeng Zhang, Fangxing Zhang, Jian Jian, Zeming Fan, Lin Liu, Chunchuan Yang, Lidan Zhou and Siyuan Yu

    PlasmaPro 100 ICPCVD

    Photonics, Optoelectronics

    January 2016

    Broadband antireflection for a high-index substrate using SiNx/SiO2 by inductively coupled plasma chemical vapour deposition

    Kim Peng Lim, Doris K. T. Ng and Qian Wang

    PlasmaPro 100 ICPCVD

    Compound Semiconductors, MEMs, Optoelectronics

    February 2015 

    Design and fabrication of suspended indium phosphide waveguides for MEMS-actuated optical buffering

    Ng Wing H., Podoliak Nina, Horak Peter, Wu Jiang, Liu Huiyun, Stewart William J. and Kenyon Anthony J.

    PlasmaPro 100 RIE

    Optoelectronics 

    December 2010

    Dielectric Properties of Thermal and Plasma-Assisted Atomic Layer Deposited Al2O3 Thin Films

    K. B. Jinesh, J. L. van Hemmen, M. C. M. van de Sanden, F. Roozeboom, J. H. Klootwijk, W. F. A. Besling and W. M. M. Kessels

    FlexAL ALD

    Semiconductors, Quantum

    February 2008

    Fabrication of 22 nm T-gates for HEMT applications

    S. Bentley, X. Li, D. A. J. Moran and I. G. Thayne

    PlasmaPro 100 RIE

    RF Devices

    February 2007

    Optimization of plasma-enhanced chemical vapor deposition silicon oxynitride layers for integrated optics applications

    M. G. Hussein, K. Wörhoff, G. Sengo and A. Driessen

    PlasmaPro 100 PECVD

    Photonics, Optoelectronics

    October 2006

    Low-Hydrogen-Content Silicon Nitride Deposited at Room Temperature by Inductively Coupled Plasma Deposition

    Haiping Zhou, Khaled Elgaid, Chris Wilkinson and Iain Thayne

    PlasmaPro 100 ICPCVD

    RF Devices

    Our Customers' Published Research

    Creation of regular arrays of faceted AlN nanostructures via a combined top-down, bottom-up approach - R.Armstrong, P-M.Coulon, P.Bozinakis, R.W.Martin, P.A.Shields

    High Power Si Sidewall Heaters for Fluidic Applications Fabricated by Trench-Assisted Surface Channel Technology - H. Veltkamp, Y. Zhao, M. J. de Boer, R. G. P. Sanders, R. J. Wiegerink and J. C. Lötters

    Impact of Ions on Film Conformality and Crystallinity during Plasma-Assisted Atomic Layer Deposition of TiO2 - Karsten Arts, Harvey Thepass, Marcel A. Verheijen, Riikka L. Puurunen, Wilhelmus M. M. Kessels, Harm C. M. Knoops